At Applied Diamond, we regularly add to our analytical capability in our desire to provide accurate product information and to address quality requirements. Our current list of analytical equipment/processes includes:
- Scanning Electron Microscope – great for evaluating grain size of polycrystalline films and examining fine features made by dry etching.
- Scanning White Light Interferometer – for measuring roughness and form of finely polished surfaces over relatively large areas and evaluating feature sizes after etching.
- Stylus Profilometer – measures step sizes to determine metallization and dry etching results.
- Light Microscopes – for collecting larger scale images of our small diamond parts.
- Differential Interference Contrast Microscopy – good, at high magnification, for seeing fine topographic features like scratches and uneven grain height.
- Birefringence Imaging – by imaging stress over a larger area we begin to get a sense of defect types and density in single crystal diamonds.
- Raman/Cryo-PL Spectroscopy – for determining diamond quality both from a sp3/sp2-bonded carbon standpoint and, by cooling the sample, from an NV-center standpoint.
- IR Spectroscopy – useful for identifying and quantifying contamination in synthetic diamond and its performance in optical applications.
- Charge Collection Distance – for testing the performance of diamond samples in active electronic and particle detector applications.
- I-V – to measure resistance and dielectric breakdown of diamond samples and the quality of electrical contacts.
- Spectral Reflectance – accurate measurements of diamond thickness from 20 nm to 1 mm.
Our experience with these techniques translates into confidence in the quality of the materials we supply you. If there is an analytical technique that you need for your work, let us know. If we cannot help you in-house, our network of contacts probably contains someone who can.